Automated Examination System using Machine Learning and Natural Language Processing
Year: 2024
Type: conference-paper
Abstract: Traditional examination processes are burdened with inefficiencies and vulnerabilities that hinder the educational process. Manual tasks such as question formulation and answer grading consume significant time and resources, while security concerns regarding physical exam materials persist. In response, this paper proposes an automated examination system leveraging advanced technological tools such as machine learning and natural language processing. By addressing the shortcomings of traditional methods and enhancing efficiency and security, this system aims to revolutionize academic evaluation.
Authors: Aman Bhadouria, Pranav Gupta, Parish Bindal, Kapil Madan, Sonal Sonal
Institution: Jaypee Institute of Information Technology
Language: English
Subfield: Information Systems
Field: Computer Science
Domain: Physical Sciences
SDG: Quality education
Open Access status: gold
OpenAlex ID: W4403854102