Work

Reasons for the Duration of Defect Handling in the L W9-72.5 Type SF6 Circuit Breaker and Corrective Measures

Year: 2024

Type: conference-paper

Source: IEEE International Conference on Sensors, Electronics and Computer Engineering (ICSECE)

DOI: 10.1109/icsece61636.2024.10729567

Authors: Shan Boyuan, Zhao Wenjing, Fan Yajun, Zhang Le, Zhao Wenbing, Chong Lin

Institution: State Grid Corporation of China (China)

Language: English

Topic: Vacuum and Plasma Arcs

Subfield: Atomic and Molecular Physics, and Optics

Field: Physics and Astronomy

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403863774

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