Year: 2024
Type: conference-paper
Abstract: The results of the analysis of the quality of the manufacturing process of the phase shifter and the identification of patterns in the distribution of diode failures in the manufacturing process for individual operations are presented. Identifying patterns of failures based on verification thermal resistance Rt
Authors: A.V. Liakhov, O.S. Fokin
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
OpenAlex ID: W4403890204