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DELECTROPHYSICAL PROPERTIES OF MULTILAYER STRUCTURE Al-TiOX-CuOX-Al

Year: 2024
Type: conference-paper
Abstract: The results of the study of memristors presented in the form of a multilayer AlTiOx-CuOx-Al structure with the property of bipolar resistive switching are shown. The samples were obtained by magnetron sputtering in an air atmosphere at a pressure of 5×10-3 mmHg. Electron microscopic analysis showed that the copper oxide layer has a columnar structure and a non-stoichiometric ratio of elements, due to which the memristive effect is enhanced.
Language: English
Open Access status: gold
OpenAlex ID: W4403890290
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