Year: 2024
Type: conference-paper
Abstract: Results of the analysis of measurement of thermal resistance (Rt) according to a technique and with device use Rth Meter, for definition of quality assurance of assemblage of microwave diodes which have high percent of failure in the course of manufacture of manufacturing of phase shifters, and also in the course of their operation are presented.
Authors: T.V. Pryaslova, O.S. Fokin
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
OpenAlex ID: W4403890310