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Pin Solder Spot Detection Algorithm Based on Improved YOLOv5s

Year: 2024

Type: conference-paper

Source: International Conference on Artificial Intelligence and Computer Information Technology (AICIT)

DOI: 10.1109/aicit62434.2024.10730286

Authors: Wenyu Tan, Weihua Jiang, Weibin Hu

Institution: Wuhan Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403918869

FWCI:

Cites: 3

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Related to: 10