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Defect Detection on Wire Based on YOLOv8

Year: 2024

Type: conference-paper

Source: International Conference on Artificial Intelligence and Computer Information Technology (AICIT)

DOI: 10.1109/aicit62434.2024.10730559

Authors: Kai Guo, Baocheng Yu

Institution: Wuhan Institute of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4403919192

FWCI: 0.755

Cites: 11

Cited by: 1

Related to: 10