Work

The Impact of Nanoscale CMOS Devices Scaling and Variations on mm-Wave CMOS Performance

Year: 2024

Type: conference-paper

Source: European Microwave Integrated Circuits Conference

DOI: 10.23919/eumic61603.2024.10732380

Authors: Jyh-Chyurn Guo, Jyun-Rong Ou

Institution: National Yang Ming Chiao Tung University

Language: English

Topic: Radio Frequency Integrated Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4403938044

FWCI:

Cites: 8

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Related to: 10