Work

Universal remaining useful life prediction for OECTs under different aging conditions

Year: 2024

Type: article

Source: Measurement Science and Technology

DOI: 10.1088/1361-6501/ad8e76

Authors: Jie Xu, Kunshu Xiao, Xinhao Wu, Tongjie Pan, Cheng-Geng Huang, Wei Huang, Yalan Ye

Institution: University of Electronic Science and Technology of China

Language: English

Topic: Reliability and Maintenance Optimization

Subfield: Safety, Risk, Reliability and Quality

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, Aeronautical Science Foundation of China, Chengdu Science and Technology Bureau, National Key Research and Development Program of China

Awards: G1620097414, G2932191731, G4468309446, G4608417242

OpenAlex ID: W4404033046

FWCI: 0.264

Cites: 45

Cited by: 1

Related to: 10