A study on the photoelectric characteristics of CMOS vertical diodes
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3055051
Authors: Ruijie Tan, Wanghui Zou
Institution: Changsha University of Science and Technology
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404034713