VAE-Based 3D Image Restoration Method for PCB Profilometry
Year: 2024
Type: article
Abstract: This paper focuses on three-dimensional measurement system of printed circuit board components. Most automated optical inspections suffer from shadows and reflections obscured by the components. We propose a new method to restore shadow and reflection regions of components for accurate shape measurements, which defines shadow and reflection regions for restoration. The region is restored with a variational auto encoder-based restoration network. It is efficient to input information about both shadow and reflection region to restore the region. Additionally, long skip connection is added to VAE for improved accuracy. We confirmed its superiority through experiments by comparing its performance with other restoration networks such as cycle generative adversarial networks and coherent semantic attention inpainting.
Source: IEEE photonics journal
Institution: Chungbuk National University
Language: English
Subfield: Industrial and Manufacturing Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $1,995
OpenAlex ID: W4404035463