A SOT-MRAM-Based CIM Design With Multi-Bit Resistance-Sum Paradigm and Non-Idealities Tuning Mechanism
Year: 2024
Type: article
Source: IEEE Transactions on Magnetics
Authors: Junzhan Liu, Liang Zhang, Jinhao Li, Shaoqing Du, Hui Jin, Hongxi Liu, Kaihua Cao, He Zhang, Wang Kang
Institution: Beihang University
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
Award: G619999071
OpenAlex ID: W4404035840