Work

Evaluating System-Level Radiation Hardness With Minimum Order Distributions

Year: 2024

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2024.3491579

Authors: Chloe A. Champagne, Brian D. Sierawski

Institution: Vanderbilt University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Aeronautics and Space Administration

Award: G6509107423

OpenAlex ID: W4404036022

FWCI:

Cites: 27

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Related to: 10