Work

Enhanced Metal Sheet Quality Control Using CNN and SVM Integration

Year: 2024

Type: conference-paper

DOI: 10.1109/iceect61758.2024.10739300

Authors: Agampreet Singh, Kanwarpartap Singh Gill, Mukesh Kumar, Ruchira Rawat

Institutions: Chitkara University, Graphic Era Hill University, Graphic Era University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404036037

FWCI: 0.755

Cites: 10

Cited by: 1

Related to: 10