Work

Evaluation and Mitigation of Single Event Upset on the Accuracy of Neural Network Accelerators

Year: 2024

Type: conference-paper

Source: IEEE Information Technology, Networking, Electronic and Automation Control Conference (ITNEC)

DOI: 10.1109/itnec60942.2024.10733146

Authors: Yuxuan Huang, Kui Liu, Wenxing Zhu, Ning Zhang

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Key Research and Development Program of China

Award: G7326417296

OpenAlex ID: W4404036181

FWCI: 0.781

Cites: 14

Cited by: 1

Related to: 10