Work

Improving CPU Fault Injection Simulations: Insights from RTL to Instruction-Level Models

Year: 2024

Type: conference-paper

Source: Workshop on Fault Detection and Tolerance in Cryptography (FDTC)

DOI: 10.1109/fdtc64268.2024.00009

Authors: Jasper van Woudenberg, Rajesh Velegalati, Cees-Bart Breunesse, Dennis Vermoen Riscure

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404036205

FWCI:

Cites: 8

Cited by:

Related to: 10