Work

Analysis and Improvement of the Causes of Poor Production and Issuance of Integrated Circuit Cards

Year: 2024

Type: conference-paper

Source: IEEE Information Technology, Networking, Electronic and Automation Control Conference (ITNEC)

DOI: 10.1109/itnec60942.2024.10732981

Authors: Yusong Ma, Jianqiang Li, Yan Li, Xiang Wang, Xianwu Zhou

Language: English

Topic: RFID technology advancements

Subfield: Media Technology

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404036743

FWCI:

Cites: 1

Cited by:

Related to: 10