Work

Scanning Electron Microscopy Applied to RF Primary Reference Standards

Year: 2024

Type: conference-paper

Source: IEEE Biennial Congress of Argentina (ARGENCON)

DOI: 10.1109/argencon62399.2024.10735857

Authors: Guillermo Monasterios, Martin Musumano, Jorge Campbell, Maria Soledad Pereda

Institution: National Institute of Industrial Technology

Language: English

Topic: Microwave and Dielectric Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404036855

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Cites: 7

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Related to: 10