Work

Loading Effect Influence in Bandwidth Measurements for High Input Impedance Oscilloscopes

Year: 2024

Type: conference-paper

Source: IEEE Biennial Congress of Argentina (ARGENCON)

DOI: 10.1109/argencon62399.2024.10735823

Authors: Alejandro Henze, Hernando Silva

Institution: National Institute of Industrial Technology

Language: English

Topic: Advanced Electrical Measurement Techniques

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404036873

FWCI: 0.78

Cites:

Cited by: 1

Related to: 10