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Robust Learning-to-Rank Algorithm for Bug Discovery in Hardware Verification

Year: 2024

Type: conference-paper

Source: IEEE International System-on-Chip Conference (SOCC)

DOI: 10.1109/socc62300.2024.10737744

Author: Hongsup Shin

Language: English

Topic: Software Testing and Debugging Techniques

Subfield: Software

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404057180

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Cites: 9

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Related to: 10