Work

STT-MRAM Based ESD and EFT Immunity Analysis

Year: 2024

Type: conference-paper

Source: International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

DOI: 10.1109/emccompo61192.2024.10742064

Authors: Jianfei Wu, Yanfang Lu, Yang Li, Hongli Zhang, Yiming Zhang, Xing Zhao, Wei Zhu

Institutions: National University of Defense Technology, Tianjin Institute of Advanced Technology, Hebei University of Technology, Chinese Academy of Sciences, Institute of Microelectronics

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Research and Development

OpenAlex ID: W4404101647

FWCI: 0.806

Cites: 4

Cited by: 1

Related to: 10