Work

Assessing IEMI Vulnerabilities in MEMS Barometers: A Comparative Approach

Year: 2024

Type: conference-paper

Source: International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

DOI: 10.1109/emccompo61192.2024.10742028

Authors: Louis Cesbron Lavau, Michael Suhrke, Peter Knott

Institutions: Fraunhofer Institute for Technological Trend Analysis, Fraunhofer Institute for High Frequency Physics and Radar Techniques

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404101654

FWCI: 0.806

Cites: 7

Cited by: 1

Related to: 10