Work

Research and Application Progress on Electromagnetic Reliability of Integrated Circuits in the Past Decade

Year: 2024

Type: conference-paper

Source: International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

DOI: 10.1109/emccompo61192.2024.10742025

Authors: Ledong Chen, Jianfei Wu, Changlin Han, Honghai Liu, Xuesong Wang, Jibin Liu

Institution: National University of Defense Technology

Language: English

Topic: Electromagnetic Compatibility and Noise Suppression

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404102132

FWCI:

Cites: 30

Cited by:

Related to: 10