Work

Functional Failures in a Sensor Application caused by System-level ESD

Year: 2024

Type: conference-paper

Source: International Workshop on the Electromagnetic Compatibility of Integrated Circuits (EMC Compo)

DOI: 10.1109/emccompo61192.2024.10742014

Author: Stefan Jahn

Institution: Infineon Technologies (Germany)

Language: English

Topic: Electrostatic Discharge in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404102896

FWCI:

Cites: 6

Cited by:

Related to: 10