Data-Driven Transient Stability Assessment by Modal Patterns-Based Severity Indices
Year: 2024
Type: conference-paper
Authors: J.M. Ramos-Guerrero, R.D. Reyes, F. Zelaya-Arrazabal, M.R.A. Paternina, A. Zamora
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404133193
