Work

Impact of in situ heating on the structure, morphology, and electrical and optical properties of RF-sputtered NiO thin films

Year: 2024

Type: article

Source: Journal of Vacuum Science & Technology B Nanotechnology and Microelectronics Materials Processing Measurement and Phenomena

DOI: 10.1116/6.0003939

Authors: Nguyen Khac Binh, Pham Ngoc Yen Nhi, Tran Bao Quan, Pham Minh Tam, Nguyen Ngoc Phuong, Dao Minh Tuan, Pham Thi Kim Hang, Pham Hoai Phuong

Institutions: Trường ĐH Nguyễn Tất Thành, Vietnam National University Ho Chi Minh City, Ho Chi Minh City University of Science, Ho Chi Minh City University of Technology and Engineering, Vietnam Academy of Science and Technology

Language: English

Topic: ZnO doping and properties

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funder: Trường Đại học Nguyễn Tất Thành

Award: G8249556451

OpenAlex ID: W4404141730

FWCI: 0.768

Cites: 33

Cited by: 8

Related to: 10