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Intelligent detection of wood defects based on 3D scanning technology

Year: 2024

Type: conference-abstract

Source: International Conference on Advanced Algorithms and Neural Networks (AANN)

DOI: 10.1117/12.3049726

Authors: Cong Tian, Xiwen Wei, Tianwei Zhang

Institution: Heilongjiang University of Technology

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404183354

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