Work

Research on printed circuit board inspection based on genetic simulated annealing algorithm

Year: 2024

Type: conference-paper

Source: International Conference on Advanced Algorithms and Neural Networks (AANN)

DOI: 10.1117/12.3049653

Authors: Juan Su, Bintao Wang, Shengnan Wen, Zhinan Du

Institution: Xi'an Shiyou University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404183368

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