Measurement of the crystallization and phase transition of niobium dioxide thin-films using a tube furnace optical transmission system
Year: 2024
Type: article
Abstract: Niobium dioxide has a volatile memristive phase change that occurs ∼800 °C that makes it an ideal candidate for future neuromorphic electronics. A straightforward optical system has been developed on a horizontal tube furnace for in situ spectral measurements as an as-grown Nb2O5 film is annealed and ultimately crystallizes as NbO2. The system measures the changing spectral transmissivity of Nb2O5 as it undergoes both reduction and crystallization processes. We were also able to measure the transition from metallic-to-non-metallic NbO2 during the cooldown phase, which is shown to occur about 100 °C lower on a sapphire substrate than fused silica. After annealing, the material properties of the Nb2O5 and NbO2 were assessed via x-ray photoelectron spectroscopy, x-ray diffraction, and 4-point resistivity, confirming that we have made crystalline NbO2.
Source: AIP Advances
DOI: 10.1063/5.0228400
Authors: Zachary R. Robinson, Karsten Beckmann, James Michels, Vincent Daviero, Elizabeth A. Street, Fiona Lorenzen, Matthew C. Sullivan, Nathaniel Cady, Alexander C. Kozen, Jeffrey M. Woodward, Marc Currie
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: gold
Estimated APC paid: $1,350
Awards: G3410231735, G3840613082, RUI: Collaborative Research: Structural and Compositional Modification of Memristive Niobium Oxide Films for Neuromorphic Computing Applications, G721004758, RUI: Structural and compositional modification of memristive niobium oxide films for neuromorphic computing applications
OpenAlex ID: W4404229119