Work

Total-Ionizing-Dose Effects in Integrated Silicon Phase Shifters Using Localized X-Ray Pulses

Year: 2024

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2024.3496297

Authors: Mozhgan Hosseinzadeh, Jeffrey W. Teng, Brett L. Ringel, Peter J. Francis, Justin P. Heimerl, George N. Tzintzarov, Arielle Little, Jeremy P. Bonsall, Stephen D. LaLumondiere, Daniele M. Monahan, John D. Cressler

Institutions: Georgia Institute of Technology, The Aerospace Corporation

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W4404239112

FWCI: 0.312

Cites: 56

Cited by: 3

Related to: 10