Combinational Standard Cells Adjacency Effect Analysis on Soft Error Occurrence Using Device-Level Simulations
Year: 2024
Type: conference-paper
Authors: Ali Zarei, Amir M. Hajisadeghi, Hamid R. Zarandi
Institution: Amirkabir University of Technology
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404239206