Work

Improving the Classification of Defect Levels in Main Electrical Equipment Through Advanced Prompting on a Large Language Model

Year: 2024

Type: article

Source: International Journal of High Speed Electronics and Systems

DOI: 10.1142/s0129156425401160

Authors: Yan Zhou, Long Chen, Qiang Wei, Yan Su, Binrui Qiao, Ying Guo, Wei Geng

Institution: State Grid Corporation of China (China)

Language: English

Topic: Topic Modeling

Subfield: Artificial Intelligence

Field: Computer Science

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404286789

FWCI: 0.444

Cites: 6

Cited by: 3

Related to: 10