Work

Trends in Millimeter-Wave and THz Test Equipment

Year: 2024

Type: conference-paper

Source: IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)

DOI: 10.1109/bcicts59662.2024.10745721

Authors: Eric Bryerton, Jeffrey Hesler

Institution: Virginia Diodes (United States)

Language: English

Topic: Terahertz technology and applications

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404295227

FWCI:

Cites: 4

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Related to: 10