Work

On the Emitter Back-Injection Current in Advanced SiGe HBTs at Cryogenic Temperatures

Year: 2024

Type: conference-paper

Source: IEEE BiCMOS and Compound Semiconductor Integrated Circuits and Technology Symposium (BCICTS)

DOI: 10.1109/bcicts59662.2024.10745717

Authors: Xiaodi Jin, Prateek Kumar, Michael Schröter

Institution: Technische Universität Dresden

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Science Foundation

OpenAlex ID: W4404295517

FWCI: 3.893

Cites: 16

Cited by: 5

Related to: 10