Work

DMPDD-Net: An Effective Defect Detection Method for Aluminum Profiles Surface Defect

Year: 2024

Type: article

Source: IEEE Transactions on Instrumentation and Measurement

DOI: 10.1109/tim.2024.3497168

Authors: Tingting Sui, Junwen Wang

Institution: Shanghai Dianji University

Language: English

Topic: Industrial Vision Systems and Defect Detection

Subfield: Industrial and Manufacturing Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G8684941703

OpenAlex ID: W4404317078

FWCI: 4.581

Cites: 43

Cited by: 22

Related to: 10