Work

Bond Wire Failure Monitoring of SiC MOSFETs Based on the Body Diode Voltage

Year: 2024

Type: article

Source: IEEE Journal of Emerging and Selected Topics in Power Electronics

DOI: 10.1109/jestpe.2024.3497938

Authors: Xiaolei Wang, Pengju Sun, Yinghui Yang

Institutions: Chongqing University, State Grid Corporation of China (China), State Grid Henan Electric Power Company (China)

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G3720819286

OpenAlex ID: W4404317182

FWCI: 0.312

Cites: 17

Cited by: 3

Related to: 10