Optimal use of data for PTC characterization of photon counting capable sensors
Year: 2024
Type: conference-paper
DOI: 10.1117/12.3034018
Authors: David P. Haefner, Aaron J. Hendrickson
Language: English
Topic: CCD and CMOS Imaging Sensors
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404400818
