Scan-Based Radiation Test Method Using SRAM Dosimeter for Beam Characterization
Year: 2024
Type: article
Authors: Saqib A. Khan, Daeyong Eom, Changhee Cho, Seungjoo Woo, Hyeonju Kim, Sung S. Chung, Joongsik Kih, Kiseog Kim, Stephen Wender, Keunwoo Lee, Youngboo Kim
Institution: Los Alamos National Laboratory
Language: English
Subfield: Electrical and Electronic Engineering
Field: Engineering
Domain: Physical Sciences
Open Access status: closed
OpenAlex ID: W4404483404