Work

Direct measurement of the real strength of near-field electric field

Year: 2024

Type: article

Source: Applied Physics Letters

DOI: 10.1063/5.0226084

Authors: Yihang Fan, Jianqiao Zhao, Fei Yang, Xiaotian Xue, Weipeng Wang, Ji Zhou, Zhengjun Zhang

Institutions: Tsinghua University, State Key Laboratory of New Ceramics and Fine Processing

Language: English

Topic: Near-Field Optical Microscopy

Subfield: Biomedical Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: National Natural Science Foundation of China

Award: G2430748209

OpenAlex ID: W4404485239

FWCI: 0.314

Cites: 45

Cited by: 3

Related to: 10