Work

Impact of Interfacial Atomic Ratios on Stabilized Transport Properties in Defective Josephson Junctions

Year: 2024

Type: article

Source: IEEE Transactions on Electron Devices

DOI: 10.1109/ted.2024.3496433

Authors: Junling Qiu, Shuya Wang, Huihui Sun, Chuanbing Han, Yonglong Shen, Yibin Hu, Bo Zhao, Zheng Shan

Institutions: PLA Information Engineering University, Zhengzhou University, Hongzhiwei Technology (China)

Language: English

Topic: Superconducting and THz Device Technology

Subfield: Astronomy and Astrophysics

Field: Physics and Astronomy

Domain: Physical Sciences

Open Access status: closed

Funder: Major Science and Technology Project of Hainan Province

Award: G6055653047

OpenAlex ID: W4404520690

FWCI: 0.191

Cites: 56

Cited by: 1

Related to: 10