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A Comparative Analysis of Machine Learning and Deep Learning Approaches in Deepfake Detection

Year: 2024

Type: conference-paper

Source: IEEE Region 10 Symposium (TENSYMP)

DOI: 10.1109/tensymp61132.2024.10752209

Authors: Mudit Vashistha, Sarthak Jain, Shubham Pandey, Aryan Pradhan, Sandhya Tarwani

Institution: Vivekananda Institute of Professional Studies

Language: English

Topic: Digital Media Forensic Detection

Subfield: Computer Vision and Pattern Recognition

Field: Computer Science

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404520893

FWCI: 0.917

Cites:

Cited by: 4

Related to: 10