Work

Enhancing Total-Ionizing-Dose Effects in the Partial Insulator in a Buried-Channel-Array Transistor: A Structural Proposal and Analytical Approach

Year: 2024

Type: article

Source: IEEE Transactions on Device and Materials Reliability

DOI: 10.1109/tdmr.2024.3503576

Authors: Je Won Park, Dongyeong Kim, Suyeon Kim, Shinwook Kim, Jeonghyeon Yun, Chaehyuk Lim, Hyeona Seo, Sowon Kim, Juwon Lee, Hyerin Lee, Geon Kim, Jinseok Park, Seungchan Lee, Yong-Bok Lee, Sokhee P. Jung, Myoung Jin Lee

Institution: Chonnam National University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funders: National Research Foundation of Korea, Samsung, Institute for Information and Communications Technology Promotion

Awards: G111569100, G184261463, G3442994718, G649758707, G68318506

OpenAlex ID: W4404562973

FWCI: 0.41

Cites: 38

Cited by: 4

Related to: 10