Work

Characterizing Interconnects to 325 GHz

Year: 2024

Type: article

Abstract: We developed an interconnect characterization procedure that first embeds the interconnect into the error boxes of a multiline thru-reflect-line (mTRL) calibration and subsequently de-embeds the interconnect with a multitiered calibration. We experimentally validated our method to 325 GHz with distributed contactless interconnects in the form of broadside coupled coplanar waveguides (CPWs) as a test case. We find excellent agreement between experimental, full-wave simulations, and a distributed model of contactless interconnects. This work provides a general method to accurately characterize interconnects and to translate measurement reference planes beyond interconnect boundaries when one or more interconnect ports are not directly accessible.

Source: IEEE Transactions on Microwave Theory and Techniques

DOI: 10.1109/tmtt.2024.3496657