Work

Experimental Evaluation of a Gate-Step-Response Method for Device Identification used in Self-Configurable Gate-Drive Units

Year: 2024

Type: conference-paper

DOI: 10.1109/ecceeurope62508.2024.10751952

Authors: Marcus Jackson, Enes Ayaz, Shahriar Sarmast Ghahfarokhi, Bhanu Pratap Singh, Hans-Peter Nee, Staffan Norrga, Tomas Jonsson, Jang-Kwon Lim, Konstantin Kostov

Institutions: KTH Royal Institute of Technology, Scania (Sweden), RISE Research Institutes of Sweden

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

Funder: EMI

OpenAlex ID: W4404564587

FWCI: 0.806

Cites:

Cited by: 1

Related to: 10