Work

Applicability of thermal impedance spectroscopy via gate voltage variation for IGBTs and SiC MOSFETs

Year: 2024

Type: conference-paper

DOI: 10.1109/ecceeurope62508.2024.10751962

Authors: Michael Gleissner, Florian Soller, Mark-M. Bakran

Institution: University of Bayreuth

Language: English

Topic: Silicon Carbide Semiconductor Technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404565149

FWCI:

Cites: 15

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Related to: 10