Work

Interface Diagnostics: Equivalent Circuit Characterization for a Growing Bulk Single Crystal

Year: 2024

Type: article

Source: Crystal Growth & Design

DOI: 10.1021/acs.cgd.4c01339

Authors: Weitao Zheng, Yunzhong Zhu, Xianlong Jiang, Yuchong Ding, Biao Wang

Institutions: Sun Yat-sen University, China Electronics Technology Group Corporation

Language: English

Topic: Solidification and crystal growth phenomena

Subfield: Materials Chemistry

Field: Materials Science

Domain: Physical Sciences

Open Access status: closed

Funders: National Natural Science Foundation of China, National Key Research and Development Program of China, Basic and Applied Basic Research Foundation of Guangdong Province

Awards: G2822571818, G6928094636, G745199344, G7916087894

OpenAlex ID: W4404568184

FWCI: 0.19

Cites: 36

Cited by: 2

Related to: 10