Work

Investigating the Effects of Individual Neutron-Induced Defects in Bipolar Junction Transistors

Year: 2024

Type: article

Source: IEEE Transactions on Nuclear Science

DOI: 10.1109/tns.2024.3504375

Authors: Sneha Banerjee, Xujiao Gao, Joshua M. Young, Le Thanh Triet Ho, Lawrence Musson, Hugh Barnaby, Thomas Buchheit

Institutions: Sandia National Laboratories, Arizona State University

Language: English

Topic: Radiation Effects in Electronics

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

OpenAlex ID: W4404577179

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