Work

Latency Insertion Method for Fast Electro-Thermal Simulation of FinFET with Self-Heating Effect

Year: 2024

Type: conference-paper

Source: IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

DOI: 10.1109/epeps61853.2024.10754220

Authors: Yi Zhou, José E. Schutt-Ainé

Institution: University of Illinois Urbana-Champaign

Language: English

Topic: Advancements in Semiconductor Devices and Circuit Design

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

Open Access status: closed

Funder: Army Research Office

Award: G3943514927

OpenAlex ID: W4404577389

FWCI: 2.418

Cites:

Cited by: 3

Related to: 10