Work

Agile Analysis for Worst-Case Eye-Diagrams in Multi-Line Links of CoWoS Packaging

Year: 2024

Type: conference-paper

Source: IEEE Conference on Electrical Performance of Electronic Packaging and Systems (EPEPS)

DOI: 10.1109/epeps61853.2024.10754244

Authors: Zhu-Chen Chang, Chien-Min Lin, Ruey-Beei Wu

Institution: National Taiwan University

Language: English

Topic: 3D IC and TSV technologies

Subfield: Electrical and Electronic Engineering

Field: Engineering

Domain: Physical Sciences

SDG: Industry, innovation and infrastructure

Open Access status: closed

OpenAlex ID: W4404577394

FWCI: 0.781

Cites: 4

Cited by: 1

Related to: 10