Causal RL Prediction of Fine-Pitch Interconnects Using Neural Networks
Year: 2024
Type: conference-paper
Abstract: In this study, we compare physics-aware neural networks for modeling fine-pitch interconnects. Results show a 5-fold reduction in test loss when imposing DC resistance through analytical equations and preserving the causality relation between resistance and inductance.
Authors: Hasan Said Ünal, Ahmet Cemal Durgun
Institution: Middle East Technical University
Language: English
Field: Materials Science
Domain: Physical Sciences
Open Access status: green
OpenAlex ID: W4404577424